The European Physical Journal Applied Physics (EPJ AP)

Characterization of reactively evaporated TiO₂ thin films as high and medium index layers for optical applications

M. H. Asghar, F. Placido and S. Naseem

Eur. Phys. J. Appl. Phys., 35 3 (2006) 177-184

Published online: 19 July 2006

DOI: 10.1051/epjap:2006087

M. H. Asghar

F. Placido

S. Naseem

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