The European Physical Journal Applied Physics (EPJ AP)

Low temperature semi-quantitative analysis of local electrical field in silicon diode by transmission electron microscopy

C. Cabanel, D. Brouri and J. Y. Laval

Eur. Phys. J. Appl. Phys., 34 2 (2006) 107-116

Published online: 18 May 2006

DOI: 10.1051/epjap:2006042

C. Cabanel

D. Brouri

J. Y. Laval

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