The European Physical Journal Applied Physics (EPJ AP)

Fowler-Nordheim current modeling of metal/ultra-thin oxide/semiconductor structures in the inversion mode, defects characterization

Y. Khlifi, K. Kassmi, A. Aziz and F. Olivie

Eur. Phys. J. Appl. Phys., 28 1 (2004) 27-41

Published online: 25 June 2004

DOI: 10.1051/epjap:2004157

Y. Khlifi

K. Kassmi

A. Aziz

F. Olivie

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