The European Physical Journal Applied Physics (EPJ AP)

Comparative study on residual strain profiles in GaAs substrates grown by LEC and VB techniques

T. Kawase, M. Tatsumi, M. Fukuzawa and M. Yamada

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 353-356

Published online: 15 July 2004

DOI: 10.1051/epjap:2004147

T. Kawase

M. Tatsumi

M. Fukuzawa

M. Yamada

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