The European Physical Journal Applied Physics (EPJ AP)

Contact-free investigation of the EL2-defect in the surface of GaAs wafers

B. Gründig-Wendrock, K. Dornich, T. Hahn, U. Kretzer and J. R. Niklas

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 363-366

Published online: 15 July 2004

DOI: 10.1051/epjap:2004111

B. Gründig-Wendrock

K. Dornich

T. Hahn

U. Kretzer

J. R. Niklas

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