The European Physical Journal Applied Physics (EPJ AP)

Luminescence and EPR studies of defects in Si-SiO₂ films

M. Baran, B. Bulakh, N. Korsunska, L. Khomenkova and J. Jedrzejewski

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 285-287

Published online: 15 July 2004

DOI: 10.1051/epjap:2004089

M. Baran

B. Bulakh

N. Korsunska

L. Khomenkova

J. Jedrzejewski

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