The European Physical Journal Applied Physics (EPJ AP)

Backside failure analysis of GaAs MMIC ASICs

F. Beaudoin, D. Carisetti, J. C. Clement, R. Desplats and P. Perdu

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 475-477

Published online: 15 July 2004

DOI: 10.1051/epjap:2004081

F. Beaudoin

D. Carisetti

J. C. Clement

R. Desplats

P. Perdu

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