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Backside failure analysis of GaAs MMIC ASICs

F. Beaudoin, D. Carisetti, J. C. Clement, R. Desplats and P. Perdu
Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 475-477
Published online: 15 July 2004
DOI: 10.1051/epjap:2004081

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