The European Physical Journal Applied Physics (EPJ AP)

Stacking faults in heavily nitrogen doped 4H-SiC

K. Irmscher, J. Doerschel, H. -J. Rost, D. Schulz, D. Siche, M. Nerding and H. P. Strunk

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 243-246

Published online: 15 July 2004

DOI: 10.1051/epjap:2004057

K. Irmscher

J. Doerschel

H. -J. Rost

D. Schulz

D. Siche

M. Nerding

H. P. Strunk

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