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Breakdown voltage analysis of neutron irradiated silicon detectors

A. Bhardwaj, K. Ranjan, Namrata, S. Chatterji, A. K. Srivastava, A. Kumar, M. K. Jha and R. K. Shivpuri

Eur. Phys. J. Appl. Phys., 24 3 (2003) 171-188

Published online: 03 October 2003

DOI: 10.1051/epjap:2003073-1

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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