The European Physical Journal Applied Physics (EPJ AP)

Monitoring the structural and chemical properties of CN_x thin films during in situ annealing in a TEM

S. E. Grillo, N. Hellgren, V. Serin, E. Broitman, C. Colliex, L. Hultman and Y. Kihn

Eur. Phys. J. AP, 13 2 (2001) 97-105

Published online: 15 February 2001

DOI: 10.1051/epjap:2001118

S. E. Grillo

N. Hellgren

V. Serin

E. Broitman

C. Colliex

L. Hultman

Y. Kihn

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