The European Physical Journal Applied Physics (EPJ AP)

Impact of ultra-thinning on DC characteristics of MOSFET devices

S. Pinel, F. Lépinois, A. Cazarré, J. Tasselli, A. Marty and J. P. Bailbé

Eur. Phys. J. AP, 17 1 (2002) 41-43

Published online: 15 January 2002

DOI: 10.1051/epjap:2001011

S. Pinel

F. Lépinois

A. Cazarré

J. Tasselli

A. Marty

J. P. Bailbé

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