The European Physical Journal Applied Physics (EPJ AP)

Charge stability on thin insulators studied by atomic force microscopy

N. Felidj, J. Lambert, C. Guthmann and M. Saint Jean

Eur. Phys. J. AP, 12 2 (2000) 85-91

Published online: 15 November 2000

DOI: 10.1051/epjap:2000174

N. Felidj

J. Lambert

C. Guthmann

M. Saint Jean

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