The European Physical Journal Applied Physics (EPJ AP)

Modeling of current-voltage characteristics of metal/ultra-thin oxide/semiconductor structures

Y. Khlifi, K. Kassmi, L. Roubi and R. Maimouni

Eur. Phys. J. AP, 9 3 (2000) 239-246

Published online: 15 March 2000

DOI: 10.1051/epjap:2000110

Y. Khlifi

K. Kassmi

L. Roubi

R. Maimouni

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