The European Physical Journal Applied Physics (EPJ AP)

Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope

R. Laddada, S. Benrezzak, P. M. Adam, G. Viardot, J. L. Bijeon and P. Royer

Eur. Phys. J. AP, 6 2 (1999) 171-178

Published online: 15 May 1999

DOI: 10.1051/epjap:1999168

R. Laddada

S. Benrezzak

P. M. Adam

G. Viardot

J. L. Bijeon

P. Royer

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