The European Physical Journal Applied Physics (EPJ AP)

Dislocations in 6H-SiC and their influence on electrical properties of n-type crystals

V. Tillay, F. Pailloux, M. F. Denanot, P. Pirouz, J. Rabier, J. L. Demenet and J. F. Barbot

Eur. Phys. J. AP, 2 2 (1998) 111-115

Published online: 15 May 1998

DOI: 10.1051/epjap:1998173

V. Tillay

F. Pailloux

M. F. Denanot

P. Pirouz

J. Rabier

J. L. Demenet

J. F. Barbot

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