The European Physical Journal Applied Physics (EPJ AP)

Spectroscopic ellipsometric evaluation of multilayer thin-film roughness using a genetic algorithm

Ngoidita Natebaye, Amir Moungache, Stéphane Robert and Stéphane Capraro

Eur. Phys. J. Appl. Phys., 101 (2026) 6

Published online: 24 April 2026

DOI: 10.1051/epjap/2026003

Ngoidita Natebaye

Amir Moungache

Stéphane Robert

Stéphane Capraro

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