The European Physical Journal Applied Physics (EPJ AP)

Edge-Detected 4DSTEM - effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

Nikita Denisov, Andrey Orekhov and Johan Verbeeck

Eur. Phys. J. Appl. Phys., 100 (2025) 5

Published online: 18 February 2025

DOI: 10.1051/epjap/2025002

Nikita Denisov

Andrey Orekhov

Johan Verbeeck

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