The European Physical Journal Applied Physics (EPJ AP)

Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens technique

Vimal Raj, Mohanachandran Nair Sindhu Swapna and Sankaranarayana Iyer Sankararaman

Eur. Phys. J. Appl. Phys., 90 1 (2020) 11001

Published online: 11 June 2020

DOI: 10.1051/epjap/2020200024

Vimal Raj

Mohanachandran Nair Sindhu Swapna

Sankaranarayana Iyer Sankararaman

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