The European Physical Journal Applied Physics (EPJ AP)

Time domain reflectometry model: analysis and characterization of a chafing defect in a coaxial cable

Abelin Kameni, Florent Loete and Lionel Pichon

Eur. Phys. J. Appl. Phys., 83 3 (2018) 30601

Published online: 29 October 2018

DOI: 10.1051/epjap/2018170430

Abelin Kameni

Florent Loete

Lionel Pichon

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