The European Physical Journal Applied Physics (EPJ AP)

Comparison between two device structures of SPR enhanced UV detectors based on ZnO

Gaoming Li, Jingwen Zhang, Guangde Chen and Xun Hou

Eur. Phys. J. Appl. Phys., 80 1 (2017) 10102

Published online: 03 October 2017

DOI: 10.1051/epjap/2017170196

Gaoming Li

Jingwen Zhang

Guangde Chen

Xun Hou

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