The European Physical Journal Applied Physics (EPJ AP)

Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

Nicolas Rolland, François Vurpillot, Sébastien Duguay and Didier Blavette

Eur. Phys. J. Appl. Phys., 72 2 (2015) 21001

Published online: 03 November 2015

DOI: 10.1051/epjap/2015150233

Nicolas Rolland

François Vurpillot

Sébastien Duguay

Didier Blavette

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