The European Physical Journal Applied Physics (EPJ AP)

Integration of microwave termination based on TaN thin films on ferrite substrates

Dainan Zhang, Liang Ji and James Kolodzey

Eur. Phys. J. Appl. Phys., 72 1 (2015) 10101

Published online: 04 September 2015

DOI: 10.1051/epjap/2015140497

Dainan Zhang

Liang Ji

James Kolodzey

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)