The European Physical Journal Applied Physics (EPJ AP)

Role of height and contact interface of CNT microstructures on Si for high current field emission cathodes

A. Navitski, P. Serbun, G. Müller, R.K. Joshi, J. Engstler and J.J. Schneider

Eur. Phys. J. Appl. Phys., 59 1 (2012) 11302

Published online: 03 August 2012

DOI: 10.1051/epjap/2012120075

A. Navitski

P. Serbun

G. Müller

R.K. Joshi

J. Engstler

J.J. Schneider

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