The European Physical Journal Applied Physics (EPJ AP)

Testing of flexible InGaZnO-based thin-film transistors under mechanical strain

N.S. Münzenrieder, K.H. Cherenack and G. Tröster

Eur. Phys. J. Appl. Phys., 55 2 (2011) 23904

Published online: 11 August 2011

DOI: 10.1051/epjap/2011100416

N.S. Münzenrieder

K.H. Cherenack

G. Tröster

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