The European Physical Journal Applied Physics (EPJ AP)

Carrier lifetime influence on clamped silicon wafer resonance by PTA effect

C. Chapus, F. Augereau, J. Podlecki, G. Lévêque, A. Foucaran and J. Attal

Eur. Phys. J. Appl. Phys., 50 3 (2010) 30301

Published online: 16 April 2010

DOI: 10.1051/epjap/2010054

C. Chapus

F. Augereau

J. Podlecki

G. Lévêque

A. Foucaran

J. Attal

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