The European Physical Journal Applied Physics (EPJ AP)

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Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy

C. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, G. A. Schwartz, D. G. de Oteyza, A. Alegría and J. Colmenero

Eur. Phys. J. Appl. Phys., 50 1 (2010) 10501

Published online: 26 February 2010

DOI: 10.1051/epjap/2010010

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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