The European Physical Journal Applied Physics (EPJ AP)

Low frequency noise modeling of polycrystalline silicon thin-film transistors

W. Deng, P. Liang and C. Wei

Eur. Phys. J. Appl. Phys., 48 1 (2009) 10303

Published online: 08 July 2009

DOI: 10.1051/epjap/2009117

W. Deng

P. Liang

C. Wei

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