Raman investigation of stress and phase transformation induced in silicon by indentation at high temperaturesS. Kouteva-Arguirova, V. Orlov, W. Seifert, J. Reif and H. RichterEur. Phys. J. Appl. Phys., 27 1-3 (2004) 279-283DOI: https://doi.org/10.1051/epjap:2004144
