Annealing behaviour of boron implanted defects in Si detector: impact on breakdown performanceS. Chatterji, A. Bhardwaj, K. Ranjan, Namrata, A. K. Srivastava and R. K. ShivpuriEur. Phys. J. AP, 17 3 (2002) 223-232DOI: https://doi.org/10.1051/epjap:2002016
