Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretationNicolas Rolland, François Vurpillot, Sébastien Duguay and Didier BlavetteEur. Phys. J. Appl. Phys., 72 2 (2015) 21001DOI: https://doi.org/10.1051/epjap/2015150233
