Raman scattering characterization of residual strain and alloy composition in bulk Si1−xGex crystalM. R. Islam, M. Yamada, N. V. Abrosimov, M. Kiyama and M. TatsumiEur. Phys. J. Appl. Phys., 27 1-3 (2004) 325-328DOI: https://doi.org/10.1051/epjap:2004124
