Study of the defects in oxygen implanted silicon subjected to neutron irradiation and high pressure annealingW. Jung, M. Kaniewska, A. Misiuk and C. A. LondosEur. Phys. J. Appl. Phys., 27 1-3 (2004) 115-118DOI: https://doi.org/10.1051/epjap:2004109
