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Simultaneous quantitative determination of strain and defect profiles within the active region along high-power diode laser bars by micro-photocurrent mapping

A. Gerhardt, J. W. Tomm, S. Schwirzke-Schaaf, J. Nagle, M. Oudart and Y. Sainte-Marie

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 451-454

DOI: https://doi.org/10.1051/epjap:2004098

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