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Quantitative spectroscopic strain analysis of AlGaAs-based high-power diode laser devices

J. W. Tomm, A. Gerhardt, M. L. Biermann and J. P. Holland

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 461-464

DOI: https://doi.org/10.1051/epjap:2004097

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