Luminescence and EPR studies of defects in Si-SiO2 filmsM. Baran, B. Bulakh, N. Korsunska, L. Khomenkova and J. JedrzejewskiEur. Phys. J. Appl. Phys., 27 1-3 (2004) 285-287DOI: https://doi.org/10.1051/epjap:2004089
