Determination of localized trap parameters in organic semiconductors using charge based deep level transient spectroscopy (Q-DLTS)T. P. Nguyen, J. Ip, O. Gaudin and R. B. JackmanEur. Phys. J. Appl. Phys., 27 1-3 (2004) 219-222DOI: https://doi.org/10.1051/epjap:2004079
