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Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces

T. Scheidt, E. G. Rohwer, H. M. von Bergmann and H. Stafast

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 393-397

DOI: https://doi.org/10.1051/epjap:2004069

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