Imaging subwavelength holes in chromium films in scanning near-field optical microscopy. Comparison between experiments and calculationS. Ducourtieux, S. Grésillon, J. C. Rivoal, C. Vannier, C. Bainier, D. Courjon and H. CoryEur. Phys. J. Appl. Phys., 26 1 (2004) 35-43DOI: https://doi.org/10.1051/epjap:2004014
