Defects in high temperature-pressure treated Czochralski silicon detected by photoluminescence and related methodsA. Misiuk, B. Surma and J. Bak-MisiukEur. Phys. J. Appl. Phys., 27 1-3 (2004) 301-303DOI: https://doi.org/10.1051/epjap:2003073
