Simulation of surface morphology and defects in heteroepitaxied thin filmsM. Sahlaoui, A. Ayadi, N. Fazouan, M. Addou, M. Djafari Rouhani and D. EstèveEur. Phys. J. AP, 13 3 (2001) 171-176DOI: https://doi.org/10.1051/epjap:2001131
