Impact of ultra-thinning on DC characteristics of MOSFET devicesS. Pinel, F. Lépinois, A. Cazarré, J. Tasselli, A. Marty and J. P. BailbéEur. Phys. J. AP, 17 1 (2002) 41-43DOI: https://doi.org/10.1051/epjap:2001011