Transmission electron microscopy of NdNiO3 thin films on silicon substratesP. Laffez, R. Retoux, P. Boullay, M. Zaghrioui, P. Lacorre and G. van TendelooEur. Phys. J. AP, 12 1 (2000) 55-60DOI: https://doi.org/10.1051/epjap:2000171
