Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens techniqueVimal Raj, Mohanachandran Nair Sindhu Swapna and Sankaranarayana Iyer SankararamanEur. Phys. J. Appl. Phys., 90 1 (2020) 11001DOI: https://doi.org/10.1051/epjap/2020200024
