Frequency-domain analysis method for analyzing and improving the steady-state characteristics of microcantilever in tapping-mode atomic force microscopyXiaohui Gu, Lining Sun and Changhai RuEur. Phys. J. Appl. Phys., 82 1 (2018) 10701DOI: https://doi.org/10.1051/epjap/2018180072
