2D Electric field imagery in 4H-SiC power diodes using OBIC techniqueHassan Hamad, Pascal Bevilacqua, Dominique Planson, Christophe Raynaud, Dominique Tournier, Bertrand Vergne, Mihai Lazar and Pierre BrosselardEur. Phys. J. Appl. Phys., 72 2 (2015) 20101DOI: https://doi.org/10.1051/epjap/2015150054
