Modeling of metal-ferroelectric-insulator-semiconductor structure considering the effects of interface trapsJing Sun, Xiao Rong Shi, Xue Jun Zheng, Li Tian and Zhe ZhuEur. Phys. J. Appl. Phys., 70 3 (2015) 30101DOI: https://doi.org/10.1051/epjap/2015140522
