Local current conduction due to edge dislocations in deformed GaN studied by scanning spreading resistance microscopyTakashi Yokoyama, Yasushi Kamimura, Keiichi Edagawa and Ichiro YonenagaEur. Phys. J. Appl. Phys., 61 1 (2013) 10102DOI: https://doi.org/10.1051/epjap/2012120318
