Role of height and contact interface of CNT microstructures on Si for high current field emission cathodesA. Navitski, P. Serbun, G. Müller, R.K. Joshi, J. Engstler and J.J. SchneiderEur. Phys. J. Appl. Phys., 59 1 (2012) 11302DOI: https://doi.org/10.1051/epjap/2012120075
