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Raman study on dislocation in high Al content Al_xGa_1−xN

X. Pan, X.L. Wang, H.L. Xiao, C.M. Wang, C. Feng, L.J. Jiang, H. Yin and H. Chen

Eur. Phys. J. Appl. Phys., 58 1 (2012) 10102

DOI: https://doi.org/10.1051/epjap/2012120004

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